Fig. 3

Scanning electron microscopy (SEM) images of wear debris from HXLPE, PEEK, and CoCrMo. a, b Scanning electron microscopy (SEM) images of HXLPE wear debris in two magnification fields (a magnification × 1000, b magnification × 10,000). c, d Scanning electron microscopy (SEM) images of PEEK wear debris in two magnification fields (c magnification × 1000, d magnification × 10,000). e, f Scanning electron microscopy (SEM) images of CoCrMo wear debris in two magnification fields (e magnification × 1000, f magnification × 10,000)